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November 11, 2010

IBM - Semiconductor Test

Online Auction - Internet Bidding Only
By Order of IBM, Surplus Semiconductor Tools Including:  Test, Analysis & Repair and Fab Equipment
Hopewell Junction, New York USA
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FEATURING:
  • (4) HP 82000 Test Systems
  • Zeiss LSM-310 Confocal Laser Scanning Microscope
  • Hitachi S800T Scanning Electron Microscope
  • Perkin Elmer 5100 Metal Analysis Tool
  • SemiTest SCA-2000 Surface Charge Analyzer
  • Versa Clean 1200 BOC Eco-Snow Blast Cleaning Tool
  • (2) KLA CRS3100 Laser Imaging Confocal Defect Review Stations
  • (10) Tencor TF-2 Film Thickness Measurement Tools
  • (14) ASML 300mm Wafer Tables
  • OptoMetrix Thermal Mapper / Optical Interf
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